Interaction of silica nanoparticles with a flat silica surface through neutron reflectometry

Environmental Science and Technology

Volumn 46, Issue 8, 2012, Pages 4532-4538

  Chung, Eunhyea ^a,b   Yiacoumi, Sotira ^a   Halbert, Candice ^c   Ankner, John ^c   Wang, Wei ^c   Kim, Changwoo ^b   Tsouris, Costas ^a,c  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b Korea Institute of Science and Technology   (South Korea)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTRACTIVE FORCE; BULK CONCENTRATION; DERJAGUIN-LANDAU-VERWEY-OVERBEEK THEORIES; DLVO THEORY; EXPERIMENTAL DATA; FLAT SURFACES; HIGH CONCENTRATION; HIGH IONIC STRENGTH; LOW IONIC STRENGTH; NANOSIZED SILICA; NEUTRON REFLECTOMETRY; PARTICLE CONCENTRATIONS; PARTICLE DENSITIES; SILICA NANOPARTICLES; SILICA PARTICLES; SILICA SURFACE; SURFACE INTERACTIONS; THEORETICAL CALCULATIONS;

ISOMERS; NEUTRON DIFFRACTION; NEUTRON REFLECTION; SILICA; SOLUTIONS;

IONIC STRENGTH;

NANOPARTICLE; SILICON DIOXIDE;

AQUEOUS SOLUTION; CONCENTRATION (COMPOSITION); DENSITY; EXPERIMENTAL STUDY; FORCE; NANOTECHNOLOGY; PARTICLE SIZE; POTENTIAL ENERGY; REFLECTOMETRY; SILICA;

AQUEOUS SOLUTION; ARTICLE; CHEMICAL INTERACTION; CONCENTRATION (PARAMETERS); CONTROLLED STUDY; ENERGY; FORCE; IONIC STRENGTH; NEUTRON REFLECTOMETRY; PARTICLE SIZE; REFLECTOMETRY; SURFACE PROPERTY; THEORY;

MICROSCOPY, ELECTRON, SCANNING; NANOPARTICLES; NEUTRONS; OSMOLAR CONCENTRATION; PARTICLE SIZE; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 84859813438     PISSN: 0013936X     EISSN: 15205851     Source Type: Journal    
DOI: 10.1021/es203992b     Document Type: Article

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