Scanning secondary-electron microscopy on ferroelectric domains and domain walls in YMnO 3

Applied Physics Letters

Volumn 100, Issue 15, 2012, Pages

  Li, J ^a   Yang, H X ^a   Tian, H F ^a   Ma, C ^a   Zhang, S ^b   Zhao, Y G ^b   Li, J Q ^a  

^a INSTITUTE OF PHYSICS   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGING PROCESS; ELECTRON-BEAM IRRADIATIONS; FERROELECTRIC DOMAIN STRUCTURE; FERROELECTRIC DOMAINS; HIGH-RESOLUTION TECHNIQUES; OPERATION VOLTAGE; POLAR SURFACES; PYROELECTRIC EFFECT; SECONDARY ELECTRON EMISSIONS;

ELECTRON EMISSION; SCANNING ELECTRON MICROSCOPY;

FERROELECTRICITY;

EID: 84859805764     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4704165     Document Type: Article

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