Correlation between near infrared-visible absorption, intrinsic local and global sheet resistance of poly(3,4-ethylenedioxy-thiophene) poly(styrene sulfonate) thin films

Applied Physics Letters

Volumn 100, Issue 15, 2012, Pages

  Herrmann, Felix ^a   Engmann, Sebastian ^a   Presselt, Martin ^a   Hoppe, Harald ^a   Shokhovets, Sviatoslav ^a   Gobsch, Gerhard ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; DIELECTRIC FUNCTIONS; ELECTRICAL MEASUREMENT; ELECTRICAL RESISTANCES; FREE CHARGE CARRIERS; HIGHLY SENSITIVE; INTRABAND TRANSITIONS; INTRINSIC RESISTANCE; MEASUREMENT SETUP; OPTICAL CHARACTERIZATION OF THIN FILMS; OPTICAL METHODS; ORGANIC LAYERS; PEDOT:PSS; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; POLY(STYRENE SULFONATE);

SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; THIOPHENE;

CONDUCTING POLYMERS;

EID: 84859800792     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3697402     Document Type: Article

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