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Volumn 85, Issue 4, 2012, Pages

Robust trapped-ion quantum logic gates by continuous dynamical decoupling

Author keywords

[No Author keywords available]

Indexed keywords

AC STARK SHIFT; DYNAMICAL DECOUPLING; QUANTUM COHERENCE; QUANTUM GATES; QUANTUM LOGIC GATE; TRAPPED ION; TWO-QUBIT; UNDERLYING MECHANISM;

EID: 84859798480     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.85.040302     Document Type: Article
Times cited : (123)

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