Two-dimensional x-ray beam phase sensing

Physical Review Letters

Volumn 108, Issue 15, 2012, Pages

  Bérujon, Sébastien ^a,b   Ziegler, Eric ^a   Cerbino, Roberto ^c   Peverini, Luca ^a,d  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^c UNIVERSITY OF MILAN   (Italy)

^d SESO   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL IMAGE CORRELATIONS; PARTIALLY COHERENT; PHASE-CONTRAST IMAGING; PIXEL SIZE; REDUCED SENSITIVITY; SINGLE SAMPLE; SPECKLE PATTERNS; X RAY BEAM;

TWO DIMENSIONAL; VIBRATIONS (MECHANICAL);

X RAY OPTICS;

EID: 84859795976     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.108.158102     Document Type: Article

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