Learning-from-signals on edge devices

IEEE Instrumentation and Measurement Magazine

Volumn 15, Issue 2, 2012, Pages 40-44

  Moore, Michael R ^a   Buckner, Mark A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION FUNCTIONS; COMPONENT SYSTEMS; DECENTRALIZED DECISION MAKING; INTEGRATED INFORMATIONS; LEARNING PROCESS; MODEL SELECTION;

LEARNING SYSTEMS; SIGNAL PROCESSING;

ALGORITHMS;

EID: 84859717296     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2012.6174579     Document Type: Article

References (5)

1. L. Carin, R. Baraniuk, V. Cevher, D. Dunson, M. Jordan, G. Sapiro, and M. Wakin, "Learning low-dimensional signal models," IEEE Signal Process. Mag., pp. 39-51, Mar. 2011.
2. M. A. Buckner, M. Bobrek, E. Farquhar, R. Kerekes, P. K. Harmer, and M. Temple, "Enhancing network security using 'learning-fromsignals' and fractional Fourier transform based RF fingerprints" 2011 Wireless Innovation Forum Conference on Communications Technologies and Software Defined Radio, accepted for publication.
3. P. K. Harmer, M. A. Temple, M. A. Buckner, and E. Farquhar, "Using differential evolution to optimize 'learning from signals' and enhance network security," Genetic and Evolutionary Computation Conference (GECCO), July 2011.
4. M. A. Buckner, "Learning from data with localized regression and differential evolution," Ph.D. dissertation, University of Tennessee, Knoxville, Tennessee, May 2003.
5. M. Moore, M. Buckner, E. D. Farquhar, and R. Kerekes, "Multidimensional learning-from-signals on edge devices," ISA Future of Instrumentation Conference, Oak Ridge, TN, Nov. 2010.Wiley & Sons, 2003.