Nanoscale characterization of synthetic polymeric porous membranes: Scrutinizing their stiffness, roughness, and chemical composition

Journal of Membrane Science

Volumn 407-408, Issue , 2012, Pages 128-135

  Barbosa, Eduardo F ^a,b   Silva, Luciano P ^a,b  

^a EMBRAPA RECURSOS GENÉTICOS E BIOTECNOLOGIA   (Brazil)

^b UNIVERSITY OF BRASILIA   (Brazil)

Author keywords

Filtration efficiency; Roughness; Stiffness; Synthetic polymeric porous membranes

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPIES (AFM); BIOMOLECULES IMMOBILIZATION; CHEMICAL COMPOSITIONS; EDS ANALYSIS; ELEMENTAL COMPOSITIONS; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FILTRATION EFFICIENCY; FILTRATION TESTS; FOURIER TRANSFORM INFRARED; FTIR; IRREGULAR TOPOGRAPHY; NANOMETRICS; NANOSCALE CHARACTERIZATION; NYLON MEMBRANES; POROUS MEMBRANES; PTFE MEMBRANES; ROUGHNESS PARAMETERS; SCANNING ELECTRON MICROSCOPIES (SEM); SEM IMAGE; SINGLE POINT; SPECTROPHOTOMETRIC MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; EFFICIENCY; ENERGY DISPERSIVE SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MEMBRANES; NITROCELLULOSE; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; STIFFNESS; SURFACE ROUGHNESS;

POLYMERS;

NYLON; POLITEF; POLYMER; POLYVINYLIDENE FLUORIDE; PYROXYLIN;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FILTRATION; INFRARED SPECTROSCOPY; MEASUREMENT; MEMBRANE COMPONENT; POROSITY; PRIORITY JOURNAL; RIGIDITY; SCANNING ELECTRON MICROSCOPY; SINGLE POINT FORCE SPECTROSCOPY; TOPOGRAPHY;

EID: 84859580411     PISSN: 03767388     EISSN: 18733123     Source Type: Journal    
DOI: 10.1016/j.memsci.2012.03.025     Document Type: Article

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