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Philosophical Magazine

Volumn 92, Issue 10, 2012, Pages 1238-1260

Size dependence of the yield strength of fcc and bcc metallic micropillars with diameters of a few micrometers

(2) Lee, Seok Woo a Nix, William D a

a Stanford University (United States)

Author keywords

compressive testing; dislocations; Frank Read source; micropillar; scaling law; strength

Indexed keywords

COMPRESSION TESTS; COMPRESSIVE TESTING; DISLOCATION DENSITIES; DISLOCATION NETWORKS; DISLOCATION SOURCES; EFFECTS OF TEMPERATURE; EXPERIMENTAL STUDIES; FRANK-READ SOURCE; MATERIAL PARAMETER; MICRO PILLARS; PHYSICAL INTERPRETATION; POWER LAW EXPONENT; POWER LAW RELATION; SIZE DEPENDENCE; STATISTICAL APPROACH; STRAIN GRADIENTS; STRENGTH;

COMPRESSION TESTING; DISLOCATIONS (CRYSTALS); SCALING LAWS; SINGLE CRYSTALS;

STRENGTH OF MATERIALS;

EID: 84859191262 PISSN: 14786435 EISSN: 14786443 Source Type: Journal
DOI: 10.1080/14786435.2011.643250 Document Type: Article

Times cited : (126)

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