Autofocusing based on wavelength dependence of diffraction in two-wavelength digital holographic microscopy

Optics Letters

Volumn 37, Issue 7, 2012, Pages 1172-1174

  Gao, Peng ^a   Yao, Baoli ^a   Rupp, Romano ^b   Min, Junwei ^a   Guo, Rongli ^a   Ma, Baiheng ^a   Zheng, Juanjuan ^a   Lei, Ming ^a   Yan, Shaohui ^a   Dan, Dan ^a   Ye, Tong ^a  

^a XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

^b UNIVERSITY OF VIENNA   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE DISTRIBUTIONS; AUTO-FOCUSING; DIFFRACTION PROCESS; DIGITAL HOLOGRAPHIC MICROSCOPY; GREEN LIGHT; IMAGE PLANE; TWO WAVELENGTH; WAVELENGTH DEPENDENCE; WAVELENGTH DEPENDENCY;

DIFFRACTION; MICROSCOPIC EXAMINATION; PHASE MEASUREMENT;

WAVELENGTH;

EID: 84859173531     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.001172     Document Type: Article

References (28)

1. E. Cuche, P. Marquet, and C. Depeursinge, Appl. Opt. 39, 4070 (2000).
2. B. Kemper and G. von Bally, Appl. Opt. 47, A52 (2008).
3. T. Colomb, F. Montfort, J. Kühn, N. Aspert, E. Cuche, A. Marian, F. Charrière, S. Bourquin, P. Marquet, and C. Depeursinge, J. Opt. Soc. Am. A 23, 3177 (2006).
4. Y. Awatsuji, M. Sasada, and T. Kubota, Appl. Phys. Lett. 85, 1069 (2004).
5. P. Langehanenberg, B. Kemper, D. Dirksen, and G. von Bally, Appl. Opt. 47, D176 (2008).
6. F. Dubois, C. Schockaert, N. Callens, and C. Yourassowsky, Opt. Express 14, 5895 (2006).
7. M. Antkowiak, N. Callens, C. Yourassowsky, and F. Dubois, Opt. Lett. 33, 1626 (2008).
8. L. Yu and L. Cai, J. Opt. Soc. Am. A 18, 1033 (2001).
9. J. Gillespie and R. A. King, Patt. Recog. Lett. 9, 19 (1989).
10. L. Ma, H. Wang, Y. Li, and H. Jin, J. Opt. A: Pure Appl. Opt. 6, 396 (2004).
11. W. Li, N. C. Loomis, Q. Hu, and C. S. Davis, J. Opt. Soc. Am. A 24, 3054 (2007).
12. M. Liebling and M. Unser, J. Opt. Soc. Am. 21, 2424 (2004).
13. C. McElhinney, J. McDonald, A. Castro, Y. Frauel, B. Javidi, and T. Naughton, Opt. Lett. 32, 1229 (2007).
14. P. Ferraro, S. Grilli, D. Alfieri, S. D. Nicola, A. Finizio, G. Pierattini, B. Javidi, G. Coppola, and V. Striano, Opt. Express 13, 6738 (2005).
15. P. Ferraro, G. Coppola, S. De Nicola, A. Finizio, and G. Pierattini, Opt. Lett. 28, 1257 (2003).
16. C. Buraga-Lefebvre, S. Coëtmellec, D. Lebrun, and C. Özkul, Opt. Lasers Eng. 33, 409 (2000).
17. F. C. A. Groen, I. T. Young, and G. Ligthart, Cytometry 6, 81 (1985).
18. Seungrag Lee, Ji Yong Lee, Wenzhong Yang, and Dug Young Kim, Opt. Express 17, 6476 (2009).
19. M. Bravo-Zanoguera, B. V. Massenbach, A. L. Kellner, and J. H. Price, Rev. Sci. Instrum. 69, 3966 (1998).
20. M. T. Özgen and T. E. Tuncer, Opt. Eng. 43, 1300 (2004).
21. J.-M. Geusebroek, F. Cornelissen, A. W. M. Smeulders, and H. Geerts, Cytometry 39, 1 (2000).
22. M. L. Tachiki, M. Itoh, and T. Yatagai, Appl. Opt. 47, D144 (2008).
23. D. Lebrun, A. Benkouider, S. Coëtmellec, and M. Malek, Opt. Express 11, 224 (2003).
24. Y. Park, G. Popescu, K. Badizadegan, R. Dasari, and M. Feld, Opt. Lett. 32, 811 (2007).
25. J. Sheng, E. Malkiel, and J. Katz, Appl. Opt. 45, 3893 (2006).
26. B. Javidi, S. Yeom, I. Moon, and M. Daneshpanah, Opt. Express 14, 3806 (2006).
27. J. Kühn, T. Colomb, F. Montfort, F. Charrière, Y. Emery, E. Cuche, P. Marquet, and C. Depeursinge, Opt. Express 15, 7231 (2007).
28. P. Ferraro, L. Miccio, S. Grilli, M. Paturzo, S. De Nicola, A. Finizio, R. Osellame, and P. Laporta, Opt. Express 15, 14591 (2007).