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Surface and Interface Analysis

Volumn 33, Issue 5, 2002, Pages 414-425

Systematic x-ray photoelectron spectroscopic study of La1-xSrx-based perovskite-type oxides

(1) Van Der Heide, P A W a

a UNIVERSITY OF HOUSTON (United States)

Author keywords

Binding energy shifts; Curve fitting; Perovskite type oxides; XPS

Indexed keywords

ANNEALING; BINDING ENERGY; COMPOSITION EFFECTS; ELECTRON ENERGY LEVELS; IONIC CONDUCTION; LANTHANUM COMPOUNDS; OXYGEN PERMEABLE MEMBRANES; PARTIAL PRESSURE; SEGREGATION (METALLOGRAPHY); SPECTRUM ANALYSIS; SUBSTITUTION REACTIONS; SURFACE PHENOMENA; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRONEGATIVITIES;

PEROVSKITE;

EID: 0036567357 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1227 Document Type: Article

Times cited : (290)

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