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Journal of Applied Physics

Volumn 111, Issue 5, 2012, Pages

A statistical model of write-errors in bit patterned media

(6) Kalezhi, Josephat a,b Greaves, Simon J c Kanai, Yasushi d Schabes, Manfred E e Grobis, Michael e Miles, Jim J a

a UNIVERSITY OF MANCHESTER (United Kingdom)

b Department of Environmental and Plant Sciences (Zambia)

c TOHOKU UNIVERSITY (Japan)

d NIIGATA INSTITUTE OF TECHNOLOGY (Japan)

e HITACHI AMERICA LTD (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED FIELD; BINARY DIGITS; BIT-PATTERNED MEDIA; COERCIVITIES; COMPUTATIONAL COSTS; ERROR RATE; EXCHANGE COUPLED; EXPERIMENTAL DATA; MAGNETIC CHARACTERISTIC; MAGNETIC ISLAND; MEDIUM DESIGN; MICROMAGNETIC MODELS; NANO SCALE; RECORDING PERFORMANCE; SINGLE LAYER; STATISTICAL MODELS; STORAGE MEDIUM; SWITCHING FIELD; TWO LAYERS; WRITE HEADS;

COERCIVE FORCE; ERRORS; MAGNETIC STORAGE; SYSTEMS ANALYSIS;

NANOCOMPOSITE FILMS;

EID: 84858973680 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3691947 Document Type: Article

Times cited : (8)

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