Negative thermal expansion in crystals with the zincblende structure: An EXAFS study of CdTe

Journal of Physics Condensed Matter

Volumn 24, Issue 11, 2012, Pages

  Abd El All, N ^a,e   Dalba, G ^a   Diop, D ^b   Fornasini, P ^a   Grisenti, R ^a   Mathon, O ^c   Rocca, F ^d   Thiodjio Sendja, B ^b,f   Vaccari, M ^c  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITÉ CHEIKH ANTA DIOP   (Senegal)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d IFN CNR   (Italy)

^e Assiut University   (Egypt)

^f UNIVERSITY OF YAOUNDÉ I   (Cameroon)

Author keywords

[No Author keywords available]

Indexed keywords

BOND-STRETCHING; CDTE; EFFECTIVE FORCES; EXAFS; EXAFS STUDIES; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FORCE CONSTANTS; LIQUID HELIUM; LOCAL PARAMETERS; MEAN SQUARE; NEGATIVE THERMAL EXPANSION; RELATIVE DISPLACEMENT; ROOM TEMPERATURE; SEPARATE ANALYSIS; STRUCTURAL PARAMETER; TEMPERATURE DEPENDENCE; TETRAHEDRALLY BONDED SEMICONDUCTORS; THERMODYNAMIC BEHAVIOUR; VALENCE-FORCE FIELD MODEL; ZINCBLENDE STRUCTURES;

BUOYANCY; CADMIUM; CADMIUM TELLURIDE; COPPER COMPOUNDS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; GERMANIUM; LIQUEFIED GASES; SUPERFLUID HELIUM; TELLURIUM; TELLURIUM COMPOUNDS; ZINC SULFIDE;

CRYSTAL STRUCTURE;

EID: 84858205412     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/11/115403     Document Type: Article

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