Microwave dielectric properties and microstructures of Nd(Mg 0.5Sn 0.5-xTi x)O 3 ceramics

Ceramics International

Volumn 38, Issue 4, 2012, Pages 2927-2934

  Chen, Yih Chien ^a   Tsai, Ren Jie ^a   Wu, Chung Yen ^a  

^a LUNGHWA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

A. Sintering; C. Dielectric properties; Ceramic; X ray diffraction

Indexed keywords

CERAMIC; MICROWAVE DIELECTRIC PROPERTIES; QUALITY FACTORS; SINTERING TEMPERATURES; SOLID STATE METHOD; TEMPERATURE COEFFICIENT OF RESONANT FREQUENCY;

DIELECTRIC PROPERTIES; MICROSTRUCTURE; MICROWAVE DEVICES; NATURAL FREQUENCIES; NEODYMIUM; SINTERING; TIN; X RAY DIFFRACTION;

CERAMIC MATERIALS;

EID: 84858078378     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2011.11.069     Document Type: Article

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