Dielectric properties of CuO-doped La2.98/3Ba 0.01(Mg0.5Sn0.5)O3 ceramics at microwave frequency

Ceramics International

Volumn 37, Issue 1, 2011, Pages 55-58

  Chen, Yih Chien ^a   Hsu, Wei Yu ^a  

^a LUNGHWA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

A. Sintering; C. Dielectric properties; Ceramic; X ray diffraction

Indexed keywords

A. SINTERING; C. DIELECTRIC PROPERTIES; CERAMIC; DIELECTRIC CONSTANTS; MICROWAVE DIELECTRIC PROPERTIES; MOBILE COMMUNICATIONS; QUALITY FACTORS; SINTERING AID; SINTERING TEMPERATURES; SOLID STATE METHOD; TEMPERATURE COEFFICIENT OF RESONANT FREQUENCY;

BARIUM; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; NATURAL FREQUENCIES; TIN; X RAY DIFFRACTION;

SINTERING;

EID: 78649325724     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2010.08.011     Document Type: Article

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