![]() |
Volumn , Issue , 2011, Pages 1883-1892
|
A virtual equipment as a test bench for evaluating virtual metrology algorithms
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BI-DIRECTIONAL LINKS;
CAD DATA;
INPUT DATAS;
PHYSICAL SIMULATION;
PROCESSING EQUIPMENT;
REACTION CHAMBERS;
SEMICONDUCTOR FABS;
STATISTICAL SIMULATION;
TEST BENCHES;
TEST DATA;
TESTING ENVIRONMENT;
VIRTUAL METROLOGY;
VIRTUAL TESTS;
ALGORITHMS;
CHEMICAL VAPOR DEPOSITION;
GRAPHICAL USER INTERFACES;
UNITS OF MEASUREMENT;
EQUIPMENT;
|
EID: 84858015014
PISSN: 08917736
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/WSC.2011.6147902 Document Type: Conference Paper |
Times cited : (1)
|
References (7)
|