Recent progress at NPL in the development of mid-infrared spectrometric measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5192, Issue , 2003, Pages 111-122

  Clarke, Frank J J ^a   Chunnilall, Christopher J ^a   Rogers, Leon J ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Hemispherical reflectance; Mid infrared; MIR spectrometers; NPL; Reflectance; Spectrometry; Spectrophotometry; Transmittance

Indexed keywords

CALIBRATION; DATA REDUCTION; FOURIER TRANSFORMS; QUALITY ASSURANCE; REFLECTION; SPECTROMETERS; SPECTROPHOTOMETRY;

HEMISPHERICAL; MID-INFRARED; TRANSMITTANCE;

SPECTROMETRY;

EID: 2342520709     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.509177     Document Type: Conference Paper

References (14)

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12. L Morren, G Vandermeersch & P Antoine, 'A study of the reflection factor of usual photometric standards in the near-infrared', Lighting Res. and Technol., 4, 243-249 (1972).
13. th Oxford Conference on Spectrometry, (Davidson, N. Carolina, June 2002) Procs. Soc. Photo-opt. Instrum. Engs., 4826, (in the press for July, 2003).
14. F J J Clarke and J A Larkin, 'Improved technique for the NPL hemispherical reflectometer', Procs. Soc. Photo-Opt. Instrum. Engs., 917, 7 - 14, (1988).