Next-generation laboratory: Solution for remote characterization of analog integrated circuits

Lab on the Web: Running Real Electronics Experiments via the Internet

Volumn , Issue , 2005, Pages 145-174

  Wulff, C ^a   Saethre T A ^a   Skjelvan, A ^a   Ytterdal, T ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

Graphics; Instruments; Laboratories; Libraries; Programming; Sections; XML

Indexed keywords

INSTRUMENTS; LABORATORIES; LIBRARIES; MATHEMATICAL PROGRAMMING; TIMING CIRCUITS; XML;

GRAPHICS; SECTIONS;

ANALOG INTEGRATED CIRCUITS;

EID: 84857713954     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/0471727709.ch4     Document Type: Chapter

References (10)

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10. C. Wulff, T. Ytterdal, T. A. Sæthre, A. Skjelvan, T. A. Fjeldly, and M. S. Shur, “Next Generation Lab-A Solution for Remote Characterization of Analog Integrated Circuits," in Proc. Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (ICCDCS-2002), Aruba, April 17-19, 2002, IEEE Catalog No. 02TH8611C, Institute of Electrical and Electronics Engineers, Piscataway, NJ, 2002, pp. I024.1-I022.4.