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Volumn , Issue , 2000, Pages
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AIM-Lab: a system for remote characterization of electronic devices and circuits over the internet
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CLIENT SERVER COMPUTER SYSTEMS;
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
CURRICULA;
ENGINEERING EDUCATION;
LABORATORIES;
NETWORK PROTOCOLS;
NETWORKS (CIRCUITS);
SEMICONDUCTOR DEVICES;
SEMICONDUCTOR DIODES;
SILICON CARBIDE;
AUTOMATED INTERNET MEASUREMENT LABORATORY;
SEMICONDUCTOR CIRCUITS;
SILICON CARBIDE DIODE;
INTERNET;
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EID: 0033725415
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (16)
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