AIM-Lab: a system for remote characterization of electronic devices and circuits over the internet

Proceedings of the IEEE International Caracas Conference on Devices, Circuits and Systems, ICCDCS

Volumn , Issue , 2000, Pages

  Fjeldly, T A ^a   Shur, M S ^a   Shen, H ^a   Ytterdal, T ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

CLIENT SERVER COMPUTER SYSTEMS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CURRICULA; ENGINEERING EDUCATION; LABORATORIES; NETWORK PROTOCOLS; NETWORKS (CIRCUITS); SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SILICON CARBIDE;

AUTOMATED INTERNET MEASUREMENT LABORATORY; SEMICONDUCTOR CIRCUITS; SILICON CARBIDE DIODE;

INTERNET;

EID: 0033725415     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)