Reduction of dielectric hysteresis in multilayered films via nanoconfinement

Macromolecules

Volumn 45, Issue 4, 2012, Pages 1954-1962

  Mackey, Matthew ^a   Schuele, Donald E ^a   Zhu, Lei ^a   Flandin, Lionel ^b   Wolak, Mason A ^c   Shirk, James S ^c   Hiltner, Anne ^a   Baer, Eric ^a  

^a Case Western Reserve University   (United States)

^b UNIVERSITÉ DE SAVOIE   (France)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADJACENT LAYERS; BROAD-BAND DIELECTRIC SPECTROSCOPY; CATALYST RESIDUES; CHARGE MIGRATION; DIELECTRIC HYSTERESIS; HIGH ENERGY DENSITIES; HIGH-FIELD; HYSTERESIS LOSS; IMPURITY IONS; ION MOVEMENTS; LAYER THICKNESS; LAYERED FILMS; LAYERED STRUCTURES; MULTI-LAYERED FILMS; NANO-METER SCALE; NANOCONFINEMENT EFFECTS; NANOCONFINEMENTS; NONUNIFORM ELECTRIC FIELD; POLARIZATION HYSTERESIS; PVDF LAYERS; SUSPENSION POLYMERIZATION; VINYLIDENE FLUORIDE; WIDE-ANGLE X-RAY DIFFRACTION;

COEXTRUSION; DIELECTRIC DEVICES; DIELECTRIC LOSSES; DIELECTRIC SPECTROSCOPY; ELECTRIC FIELDS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IONS; SURFACE ACTIVE AGENTS; X RAY DIFFRACTION;

HYSTERESIS;

EID: 84857594335     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma202267r     Document Type: Article

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