Giant birefringent optics in multilayer polymer mirrors

Science

Volumn 287, Issue 5462, 2000, Pages 2451-2456

  Weber, Michael F ^a   Stover, Carl A ^a   Gilbert, Larry R ^a   Nevitt, Timothy J ^a   Ouderkirk, Andrew J ^a  

^a 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

POLYMER;

ARTICLE; BIREFRINGENCE; CONTACT ANGLE; OPTICS; POLARIZATION; PRIORITY JOURNAL; REFLECTOMETRY; REFRACTION INDEX; REFRACTOMETRY; THICKNESS;

EID: 0034737467     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.287.5462.2451     Document Type: Article

References (31)

1. P. Baumeister and G. Pineus, Sci. Am. 223, 58 (December 1970).
2. P. Drude, Wied. Ann. 43, 146 (1891).
3. _, Ann. Phys. Chem. 38, 865 (1891).
4. D. Brewster, A Treatise on Optics (Lea & Blanchard, London, 1839).
5. M. Banning, J. Opt. Soc. Am. 37, 792 (1947).
6. P. Lissberger, Rep. Prog. Phys. 33, 197 (1970).
7. V. R. Costrich, Appl. Opt. 9, 866 (1970).
8. A. Thelen, Appl. Opt. 15, 2983 (1976).
9. _, J. Opt. Soc. Am. 70, 118 (1980).
10. T. Ito, U.S. Patent 5,579,159 (26 November 1996).
11. T. Alfrey, E. F. Gurnee, W. J. Schrenk, Polym. Eng. Sci. 9, 400 (1969).
12. C. J. Heffelfinger and K. L. Knox, The Science & Technology of Polymer Films (Interscience, New York, 1971), p. 587.
13. D. A. Holmes and D. L. Feucht, J. Opt. Soc. Am. 56, 1763 (1966).
14. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, Amsterdam, 1987), p. 119.
15. D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972).
16. P. Yeh, J. Opt. Soc. Am. 69, 742 (1979).
17. I. Hodgkinson and Q. H. Wu, J. Opt. Soc. Am. A 10, 2065 (1993).
18. J. Lekner, J. Opt. Soc. Am. A 10, 2059 (1993).
19. Y. Fink et al., Science 282, 1679 (1998).
20. Optical stack designs with isotropic materials often compensate for this reduction of p-polarization reflectivity with incidence angle by increasing the number of unit cells in the multilayer stack to such a level that the reflectivity falloff is minimized. This approach can be quite successful for isotropic multilayer interference layers with air as the external medium, but has limited utility when the external medium allows for larger propagation angles to be present in the stack.
21. R. M. A. Azzam and N. M. Bashara, in (14), p. 357 (corrected equation).
22. M. Born and E. Wolf, Principles of Optics (Pergamon, New York, ed. 5, 1975), p. 40.
23. O. S. Heavens and H. M. Liddel, Appl. Opt. 5, 373 (1966).
24. M. Born and E. Wolf, in (22), p. 66.
25. A. Thelen, J. Opt. Soc. Am. 53, 1266 (1963).
26. J. C. Kim, M. Cakmak, X. Zhou, Polymers 39, 4225 (1998).
27. J. C. Seferis, Polymer Handbook (Wiley, New York, ed. 3, 1989), p. 45.
28. M. Cakmak and J. L. White, Polym. Eng. Sci. 29, 1534 (1989).
29. R. L. Jones, S. K. Kumar, D. L. Ho, R. M. Briber, T. P. Russel, Nature 400, 146 (1999).
30. H. A. Macleod, Thin-Film Optical Filters (Macmillan, New York, ed. 2, 1986), p. 334.
31. AFM image and layer thickness analyses were provided by V. W. Jones of 3M Corporate Analytical Technology Center.