Chip-scale electrochemical differentiation of SAM-coated gold features using a probe array

Journal of the Electrochemical Society

Volumn 159, Issue 3, 2012, Pages

  Tencer, Michal ^a,b   Olivieri, Anthony ^a   Tezel, Bora ^a   Nie, Heng Yong ^c   Berini, Pierre ^a  

^a UNIVERSITY OF OTTAWA   (Canada)

^b MST Consulting   (Canada)

^c UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

A-STABILITY; AG-AGCL; CHIP-SCALE; CONTACT PADS; ELECTRICAL CONTACTS; ELECTRICAL INTEGRITY; ELECTRICAL RESISTANCES; ELECTROCHEMICAL REACTIONS; ION FRAGMENTS; PROBE ARRAY; SAMS; SURFACE COMPOSITIONS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

BEARING PADS; DESORPTION; ELECTRIC VARIABLES MEASUREMENT; ELECTROCHEMISTRY; GOLD COATINGS; SECONDARY ION MASS SPECTROMETRY;

PROBES;

EID: 84857395010     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/2.087203jes     Document Type: Article

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