Reliability and data analysis of electrical degraded system subject to random shocks

ELECO 2011 - 7th International Conference on Electrical and Electronics Engineering

Volumn , Issue , 2011, Pages

  Medjoudj, Rafik ^a   Aissani, Djamil ^a   Medjoudj, Rabah ^a  

^a UNIVERSITY OF BEJAIA   (Algeria)

Author keywords

models of shocks; reliability; short circuit

Indexed keywords

CIRCUIT BREAKER; DEGRADED SYSTEM; ELECTRICAL SUBSTATIONS; FAILURE MECHANISM; HOMOGENEOUS POISSON PROCESS; OVER CURRENT; OVER-VOLTAGES; RANDOM SHOCKS; RESIDUAL LIFETIME; SHORT-CIRCUIT; WEAR FUNCTION;

CAPACITANCE; CIRCUIT BREAKING ARCS; ELECTRIC CIRCUIT BREAKERS; ELECTRONICS ENGINEERING; POISSON DISTRIBUTION; RELIABILITY;

RELIABILITY ANALYSIS;

EID: 84857308466     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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