Characterization of a photonic strain sensor in silicon-on-insulator technology

Optics Letters

Volumn 37, Issue 4, 2012, Pages 479-481

  Westerveld, Wouter J ^a,b   Pozo, Jose ^b   Harmsma, Peter J ^b   Schmits, Ruud ^b   Tabak, Erik ^b   Van Den Dool, Teun C ^b   Leinders, Suzanne M ^a   Van Dongen, Koen W A ^b   Urbach, H Paul ^a   Yousefi, Mirvais ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE REFRACTIVE INDEX; LATERAL CONFINEMENT; MICRO RESONATORS; MODAL DISPERSION; OPTICAL MICRORING RESONATOR; PHOTONIC INTEGRATED CIRCUITS; RING RESONATOR; SILICON ON INSULATOR; SILICON-ON-INSULATORS; SOI WAVEGUIDES; STRAIN GAUGE; STRAIN SENSORS; STRAIN-INDUCED CHANGE;

DISPERSIONS; OPTICAL RESONATORS; REFRACTIVE INDEX; WAVEGUIDES;

SILICON ON INSULATOR TECHNOLOGY;

EID: 84857242303     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.000479     Document Type: Article

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