Interplay of native defect-related photoluminescence response of ZnO nanosticks subjected to 80keV Ar ion irradiation

Radiation Effects and Defects in Solids

Volumn 166, Issue 11, 2011, Pages 884-893

  Bayan, S ^a   Mohanta, D ^a  

^a TEZPUR UNIVERSITY   (India)

Author keywords

ion irradiation; nanorods; photoluminescence; ZnO

Indexed keywords

AR-ION IRRADIATION; BAND-EDGE EMISSIONS; ELECTRONIC ENERGY LOSS; ENERGETIC ION; ENERGY DEPOSITIONS; FLUENCES; HEXAGONAL WURTZITE; INTERSTITIAL DEFECTS; NANOSCALE RODS; NANOSTICKS; NATIVE DEFECT; OXYGEN VACANCY DEFECTS; PHOTOLUMINESCENCE RESPONSE; THEORETICAL MODELING; ZINC VACANCY; ZNO;

ENERGY DISSIPATION; ION BOMBARDMENT; IONIZATION; IONS; IRRADIATION; LASER RADIATION; MICROEMULSIONS; NANORODS; NUCLEAR ENERGY; OXYGEN VACANCIES; PHOTOLUMINESCENCE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZINC; ZINC OXIDE; ZINC SULFIDE;

CRYSTAL DEFECTS;

EID: 84857196760     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150.2011.596838     Document Type: Article

References (21)

1. Zheng, M.J.; Zhang, L.D.; Li, G.H.; Zhang, X.Y.;Wang, X.F. Appl. Phys. Lett. 2001, 79, 839-841.
2. Huang, X.; Li, J.; Zhang,Y.; Mascarenhas, A. J. Am. Chem. Soc. 2003, 125, 7049-7055.
3. Lin, B.; Fu, Z.; Jia,Y. Appl. Phys. Lett. 2001, 79, 943-945.
4. Lima, S.A.M.; Sigoli, F.A., Jr.; Jafelicci, M.; Davolos, M.R. Int. J. Inorg. Mater. 2001, 3, 749-754.
5. Zeng, H.; Yang, S.; Xu, X.; Cai,W. Appl. Phys. Lett. 2009, 95, 191904-1-3.
6. Roy, S.; Basu, S. Bull. Mater. Sci. 2002, 25, 513-515.
7. Young, S.J.; Ji, L.W.; Chang, S.J.; Liang, S.H.; Lam, K.T.; Fang, T.H.; Chen, K.J.; Du, X.L.; Xue, Q.K.; Sens. Actuators A 2007, 135, 523-529.
8. Willander, M.; Nur, O.; Bano, N.; Sultana, K. New J. Phys. 2009, 11, 125020-1-16.
9. Ge, J.; Tang, B.; Zhuo, L.; Shi, Z. Nanotech. 2006, 17, 1316-1322.
10. Bayan, S.; Mohanta, D. J. Appl. Phys. 2010, 108, 023512-1-6.
11. Kucheyev, S.O.;Williams, J.S.; Jagadish, C.; Zou, J.; Evans, C.; Nelson, A.J.; Hamza, A.V. Phys. Rev. B 2003, 67, 094115-1-11.
12. Bayan, S.; Mohanta, D. Nucl. Instrum. Methods B 2011, 269, 374-379.
13. Mohanta, D.; Ahmed, G.A.; Choudhury, A.; Singh, F.; Avasthi, D.K.; Boyer, G.; Stanciu, G.A. Eur. Phys. J. Appl. Phys. 2006, 35, 29-36.
14. Chattopadhyay, S.; Dutta, S.; Jana, D.; Chattopadhyay, S.; Sarkar, A.; Kumar, P.; Kanjilal, D.; Mishra, D.K.; Ray, S.K. J. Appl. Phys. 2010, 107, 113516-1-8.
15. Cao, B.; Cai,W., Li,Y.; Sun, F.; Zhang, L. Nanotech. 2005, 16, 1734-1738.
16. Gu,Y.; Kuskovsky, I.L.;Yin, M.; O'Brien, S.; Neumark, G.F. Appl. Phys. Lett. 2004, 85, 3834-3835.
17. Ye, J.D.; Gu, S.L.; Qin, F.; Zhu, S.M.; Liu, S.M.; Zhou, X.; Liu,W.; Hu, L.Q.; Zhang, R.; Shi,Y.; Zheng,Y.D. Appl. Phys. A 2005, 81, 759-762.
18. Look, D.C.; Hemsky, J.W.; Sizelove, J.R. Phys. Rev. Lett. 1999, 82, 2552-2555.
19. Zeigler, J.F.; Zeigler, M.D.; Biersack, J.P. SRIM (2008) - The Stopping and Range of Ions in Matter; 2008; www.srim.org.
20. Rackauskas, S.; Nasibulin, A.G.; Jiang, H.; Tian, Y.; Statkute, G.; Shandakov, S.D.; Lipsanen, H.; Kauppinen, E.I. Appl. Phys. Lett. 2009, 95, 183114-1-3.
21. Bayan, S.; Mohanta, D. J. Mater. Res. 2010, 25, 814-820.