Characterization of deep energy level defects in α-Al 2O 3:C using thermally assisted OSL

Radiation Measurements

Volumn 47, Issue 2, 2012, Pages 111-120

  Soni, Anuj ^a   Mishra, D R ^a   Bhatt, B C ^a   Gupta, S K ^a   Rawat, N S ^a   Kulkarni, M S ^a   Sharma, D N ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Deep traps; Photoionization cross section; Phototransfer; Thermally assisted OSL (TA OSL)

Indexed keywords

ABSORBED DOSE; BLUE LEDS; BLUE LIGHT; CONTINUOUS WAVE; DEEP ENERGY LEVELS; DEEP TRAPS; HIGH-DOSE DOSIMETRY; LINEAR HEATING RATES; OPTICAL STIMULATION; OPTICALLY STIMULATED LUMINESCENCE; PHOTOIONIZATION CROSS-SECTION; PHOTOTRANSFER; ROOM TEMPERATURE; TEMPERATURE DEPENDENCE; THERMAL STIMULATION; THERMALLY ASSISTED OSL (TA-OSL); TRAP DEPTH;

BLEACHING; CLEANING; DEFECTS; LUMINESCENCE; PHOTOIONIZATION;

ALUMINUM;

EID: 84857048804     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2011.11.009     Document Type: Article

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