Understanding metal doping for organic electron transport layers

Applied Physics Letters

Volumn 100, Issue 5, 2012, Pages

  Mityashin, Alexander ^a,b   Cheyns, David ^a   Rand, Barry P ^a   Heremans, Paul ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; CHARGE DONATION; CHARGE TRANSPORT LAYER; DOPED TRANSPORT LAYERS; DOPING EFFECTS; DOPING LEVELS; ELECTRICAL MEASUREMENT; ELECTRON TRANSPORT LAYERS; ENHANCED CONDUCTIVITY; LOW CONCENTRATIONS; METAL WORKS; METAL-DOPING; N-DOPING; PHYSICAL MECHANISM;

OPTOELECTRONIC DEVICES; SEMICONDUCTOR DOPING;

METALS;

EID: 84857025611     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3681383     Document Type: Article

References (18)

1. K. Walzer, B. Maennig, M. Pfeiffer, and K. Leo, Chem. Rev. 107, 1233 (2007). 10.1021/cr050156n
2. J. Drechsel, B. Maennig, F. Kozlowski, M. Pfeiffer, K. Leo, and H. Hoppe, Appl. Phys. Lett. 86, 244102 (2005). 10.1063/1.1935771
3. T.-Y. Cho, C.-L. Lin, and C.-C. Wu, Appl. Phys. Lett. 88, 111106 (2006). 10.1063/1.2185077
4. B. Maennig, J. Drechsel, D. Gebeyehu, P. Simon, F. Kozlowski, A. Werner, F. Li, S. Grundmann, S. Sonntag, M. Koch, Appl. Phys. A 79, 1 (2004). 10.1007/s00339-003-2494-9
5. J. Blochwitz, T. Fritz, M. Pfeiffer, K. Leo, D. M. Alloway, P. A. Lee, and N. R. Armstrong, Org. Electron. 2, 97 (2001). 10.1016/S1566-1199(01)00016-7
6. G. Werner, F. Li, K. Harada, M. Pfeiffer, T. Fritz, and K. Leo, Appl. Phys. Lett. 82, 4495 (2003). 10.1063/1.1583872
7. A. Mityashin, Y. Olivier, T. Van Regemorter, C. Rolin, S. Verlaak, N. G. Martinelli, D. Beljonne, J. Cornil, J. Genoe, and P. Heremans, Unraveling the mechanism of molecular doping in organic semiconductors., Adv. Mater. (in press).
8. Z. Q. Gao, B. X. Mi, G. Z. Xu, Y. Q. Wan, M. L. Gong, K. W. Cheah, and C. H. Chen, Chem. Commun. 1, 117 (2008). 10.1039/B713566A
9. R. Meerheim, S. Olthof, M. Hermenau, S. Scholz, A. Petrich, N. Tessler, O. Solomeshch, B. Lussem, M. Riede, and K. Leo, J. Appl. Phys. 109, 103102 (2011). 10.1063/1.3590142
10. J. Kido and T. Matsumoto, Appl. Phys. Lett. 73, 2866 (1998). 10.1063/1.122612
11. T. Mori, H. Fujikawa, S. Tokito, and Y. Taga, Appl. Phys. Lett. 73, 2763 (1998). 10.1063/1.122583
12. G. Parthasarathy, C. Shen, A. Kahn, and S. R. Forrest, J. Appl. Phys. 89, 4986 (2001). 10.1063/1.1359161
13. T. Sakurai, S. Toyoshima, H. Kitazume, S. Masuda, H. Kato, and K. Akimoto, J. Appl. Phys. 107, 043707 (2010). 10.1063/1.3309278
14. B. P. Rand, J. Li, J. Xue, R. J. Holmes, M. E. Thompson, and S. R. Forrest, Adv. Mater. 17, 2714 (2005). 10.1002/adma.v17:22
15. M. S. White, D. C. Olson, S. E. Shaheen, N. Kopidakis, and D. S. Ginley, Appl. Phys. Lett. 89, 143517 (2006). 10.1063/1.2359579
16. B. Y. Li, M. K. Fung, and Z. Xie, Adv. Mater. 14, 1317 (2002). 10.1002/1521-4095(20020916)14:18<1317::AID-ADMA1317>3.0.CO;2-S
17. E. A. Silinsh and V. Capek, Organic Molecular Crystals: Interaction, Localization, and Transport Phenomena (AIP, New York, 1994).
18. D. Cheyns, J. Poortmans, P. Heremans, C. Deibel, S. Verlaak, B. Rand, and J. Genoe, Phys. Rev. B 77, 165332 (2008). 10.1103/PhysRevB.77.165332