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Journal of Materials Science: Materials in Electronics

Volumn 23, Issue 2, 2012, Pages 605-611

Annealing effect on the characteristics of La 0.67Sr 0.33MnO 3 polycrystalline thin films produced by the sol-gel dip-coating process

(3) Goktas, Abdullah a Aslan, Ferhat a Mutlu, Ibrahim Halil a

a HARRAN UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING EFFECTS; ANNEALING TEMPERATURES; AVERAGE GRAIN SIZE; MAGNETORESISTANCE RATIO; METAL INSULATORS; PEROVSKITE STRUCTURES; PHASE FORMATIONS; POLYCRYSTALLINE; POLYCRYSTALLINE THIN FILM; QUARTZ SUBSTRATE; SCANNING ELECTRON MICROSCOPE; SMALL VARIATIONS; SOL GEL DIP COATING;

MAGNETIC FIELDS; MAGNETOS; MANGANESE OXIDE; METAL INSULATOR BOUNDARIES; PARAMAGNETISM; PEROVSKITE; QUARTZ; SCANNING ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

ANNEALING;

EID: 84856698076 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-011-0448-0 Document Type: Article

Times cited : (39)

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