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Volumn 85, Issue 1, 2012, Pages

Pore-scale evaporation-condensation dynamics resolved by synchrotron x-ray tomography

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT TEMPERATURES; ANALYTICAL MODEL; CAPILLARY CONDENSATION; CAPILLARY FORCE; CONDENSATION PROCESS; DIRECT LINKS; EVAPORATION AND CONDENSATION; EVAPORATION-CONDENSATION; EXPERIMENTAL DATA; GAS LIQUIDS; HIGH RESOLUTION; INTERFACIAL DYNAMICS; LIQUID PHASE CONTENTS; LIQUID-VAPOR; MECHANICAL BEHAVIOR; NANO SCALE; PHYSICAL SYSTEMS; PORE SCALE; ROUGH SURFACES; SINTERED GLASS; SYNCHROTRON X-RAY TOMOGRAPHY; TRANSPORT DYNAMICS; X-RAY SYNCHROTRON;

EID: 84856655835     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.85.016317     Document Type: Article
Times cited : (22)

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