Identification of the crystalline-phases in thin pentacene layers by Raman spectroscopy

Vacuum

Volumn 86, Issue 6, 2012, Pages 627-629

  Srnánek, Rudolf ^a   Jakabovič, Ján ^a   Kováč, Jaroslav ^a,b   Kovéč Jr , Jaroslav ^a,b   Haško, Daniel ^b   Šatka, Alexander ^a,b   Dobročka, Edmund ^a,c   Donoval, Daniel ^a  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^b INTERNATIONAL LASER CENTER   (Slovakia)

^c INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

Author keywords

AFM; Pentacene; Phases; Raman spectroscopy; SEM; XRD

Indexed keywords

AFM; BULK PHASE; CRYSTALLOGRAPHIC PHASIS; MICRO RAMAN SPECTROSCOPY; MICRO-RAMAN; PENTACENE LAYERS; PENTACENES; PHASES; POLARIZATION SPECTROSCOPY; XRD; XRD MEASUREMENTS;

EXCITONS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY;

RAMAN SCATTERING;

EID: 84856524167     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2011.07.012     Document Type: Conference Paper

References (9)

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