Inspection of metallic surfaces using Local Binary Patterns

IECON Proceedings (Industrial Electronics Conference)

Volumn , Issue , 2011, Pages 2227-2231

  Mansano, M ^a   Pavesi, L ^a   Oliveira, L S ^a   Britto Jr , A ^b   Koerich, A ^a  

^a UNIVERSIDADE TECNOLÓGICA FEDERAL DO PARANÁ   (Brazil)

^b STATE UNIVERSITY OF PONTA GROSSA   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY PATTERNS; BLACK LIGHT; COLOR IMAGES; DATA SETS; FEATURE SETS; GRAY-SCALE IMAGES; LOCAL BINARY PATTERNS; METALLIC SURFACE; STEEL BARS; TEXTURE FEATURES;

BARS (METAL); DEFECTS; METALLIC COMPOUNDS; ULTRAVIOLET RADIATION;

INDUSTRIAL ELECTRONICS;

EID: 84856521409     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2011.6119655     Document Type: Conference Paper

References (8)

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