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Volumn 95, Issue 2, 2012, Pages 809-815

Determination of the solubility of tin in indium oxide using in situ and ex situ X-Ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC POSITIONS; ELEMENTAL COMPOSITIONS; EX SITU; EXSOLUTION; HIGH ENERGY; HIGH-TEMPERATURE TREATMENT; IN-SITU; INDIUM OXIDE; NANO POWDERS; OVERDOPED; PHASE ANALYSIS; SOLUBILITY LIMITS; SOLUBILITY VALUE; SYNCHROTRON X RAY DIFFRACTION; THERMODYNAMIC SOLUBILITY; X RAY FLUORESCENCE;

EID: 84856512932     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2011.04999.x     Document Type: Article
Times cited : (31)

References (16)
  • 1
    • 0020115402 scopus 로고
    • Electrical properties and defect model of tin-doped indium oxide layers
    • G. Frank, and, H. Köstlin, " Electrical Properties and Defect Model of Tin-Doped Indium Oxide Layers," Appl. Phys. A, 27, 197-206 (1982). (Pubitemid 12539890)
    • (1982) Applied Physics A: Solids and Surfaces , vol.A 27 , Issue.4 , pp. 197-206
    • Frank, G.1    Kostlin, H.2
  • 2
    • 0026747553 scopus 로고
    • Structural Study of Tin-Doped Indium Oxide Thin Films Using X-Ray Absorption Spectroscopy and X-Ray Diffraction I. Description of the Indium Site
    • Ph. Parent, H. Dexpert, G. Tourillon, and, J.-M. Grimal, " Structural Study of Tin-Doped Indium Oxide Thin Films Using X-Ray Absorption Spectroscopy and X-Ray Diffraction I. Description of the Indium Site," J. Electrochem. Soc., 139, 276-81 (1992).
    • (1992) J. Electrochem. Soc. , vol.139 , pp. 276-281
    • Parent, Ph.1    Dexpert, H.2    Tourillon, G.3    Grimal, J.-M.4
  • 13
    • 0001632607 scopus 로고
    • Line Profiles of Neutron Powder-Diffraction Peaks for Structure Refinement
    • H. M. Rietveld, " Line Profiles of Neutron Powder-Diffraction Peaks for Structure Refinement," Acta Cryst., 22, 151-2 (1967).
    • (1967) Acta Cryst. , vol.22 , pp. 151-152
    • Rietveld, H.M.1
  • 15
    • 0242569586 scopus 로고    scopus 로고
    • Quantitative X-Ray Fluorescence Analysis Using Fundamental Parameters: Application to Gold Jewelry
    • V. Honkimäki, K. Hämäläinen, and, S. Manninen, " Quantitative X-Ray Fluorescence Analysis Using Fundamental Parameters: Application to Gold Jewelry," X-Ray Spectrom., 25, 215-20 (1996).
    • (1996) X-Ray Spectrom. , vol.25 , pp. 215-220
    • Honkimäki, V.1    Hämäläinen, K.2    Manninen, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.