In situ studies on the kinetics of formation and crystal structure of In4 Sn3 O12 using high-energy x-ray diffraction

Journal of Applied Physics

Volumn 104, Issue 4, 2008, Pages

  Gonzalez G B ^a,d   Okasinski, J S ^b   Mason, T O ^c   Buslaps, T ^a   Honkimaki V ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c Northwestern University   (United States)

^d DEPAUL UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFRACTION; HIGH ENERGY PHYSICS; ISOTHERMAL ANNEALING; OZONE WATER TREATMENT; POWDERS; RIETVELD ANALYSIS; RIETVELD METHOD; THERMAL EXPANSION; THERMAL SPRAYING; X RAY ANALYSIS; X RAY DIFFRACTION;

HIGH-ENERGY X-RAY DIFFRACTION; IN-SITU; JMAK EQUATION;

CRYSTAL STRUCTURE;

EID: 50849113074     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2969913     Document Type: Article

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