Influence of static electric fields on an optical ion trap

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 85, Issue 1, 2012, Pages

  Schneider, Christian ^a,b   Enderlein, Martin ^a,b   Huber, Thomas ^a,b   Dürr, Stephan ^a   Schaetz, Tobias ^a,b  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^b UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC MODELS; DIPOLE TRAPS; EXPERIMENTAL PROCEDURE; HEATING EFFECT; ION TRAPS; MONTE CARLO SIMULATION; OPTICALTRAPPING; PROOF-OF-PRINCIPLE EXPERIMENTS; SINGLE-BEAM; STATIC ELECTRIC FIELDS; STATIC ELECTRIC POTENTIAL; TECHNICAL IMPROVEMENT; TRAPPED ION;

COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRIC POTENTIAL; IONS; MONTE CARLO METHODS;

EXPERIMENTS;

EID: 84856413965     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.85.013422     Document Type: Article

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