Monitoring and tuning micro-ring properties using defect-enhanced silicon photodiodes at 1550 nm

IEEE Photonics Technology Letters

Volumn 24, Issue 4, 2012, Pages 261-263

  Logan, Dylan F ^a   Velha, Philippe ^b   Sorel, Marc ^b   De La Rue, Richard M ^b   Jessop, Paul E ^c   Knights, Andrew P ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c WILFRID LAURIER UNIVERSITY   (Canada)

Author keywords

Optical interconnections; optical waveguide components; optoelectronic devices; p i n photodiodes; semiconductor defects; semiconductor waveguides

Indexed keywords

1550 NM; IN-LINE; MICRORING RESONATOR; MICRORINGS; OPTICAL MODES; OPTICAL RESONANCE; PHOTONIC INTEGRATED CIRCUITS; PIN PHOTODIODE; POWER MONITOR; SEMICONDUCTOR WAVEGUIDE; SILICON PHOTODIODE; SILICON WAVEGUIDE; THERMAL RESONANCE;

CRYSTAL DEFECTS; DEFECTS; FEEDBACK; OPTICAL INTERCONNECTS; OPTICAL WAVEGUIDES; OPTOELECTRONIC DEVICES; PHOTODIODES; QUANTUM OPTICS; WAVEGUIDE COMPONENTS;

PHOTONIC INTEGRATION TECHNOLOGY;

EID: 84856397716     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2011.2177453     Document Type: Article

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