Sampling for shape from focus in optical microscopy

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 34, Issue 3, 2012, Pages 564-573

  Muhammad, Mannan ^a   Choi, Tae Sun ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

3D shape recovery; curve fitting; optical microscopy; Sampling step size; shape from focus

Indexed keywords

3DSHAPE RECOVERY; COMPUTATION POWER; CRITICAL FACTORS; FITTING FUNCTIONS; IMAGE FOCUS; INTER-FRAME; LARGE DATA; NYQUIST SAMPLING; OBJECT SHAPE; PASSIVE TECHNIQUE; REAL OBJECTS; SHAPE FROM FOCUS; SHAPE RECONSTRUCTION; STEP SIZE; SYSTEM APPLICATIONS;

CURVE FITTING; GAUSSIAN BEAMS; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; SHAPE OPTIMIZATION;

THREE DIMENSIONAL;

ARTICLE; IMAGE PROCESSING; METHODOLOGY; MICROSCOPY; THREE DIMENSIONAL IMAGING;

IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY;

EID: 84856204872     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2011.144     Document Type: Article

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