A novel method for shape from focus in microscopy using bezier surface approximation

Microscopy Research and Technique

Volumn 73, Issue 2, 2010, Pages 140-151

  Muhammad, Mannan Saeed ^a   Choi, Tae Sun ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

3D shape reconstruction; Bezier surface; Depth estimation; Focus measure; Microscopy; Pixel intensities; Shape from focus

Indexed keywords

IMAGE RECONSTRUCTION; INTERPOLATION;

3-D SHAPE; 3D SHAPE RECONSTRUCTION; BEZIER SURFACE; DEPTH ESTIMATION; DEPTHMAP; FOCUS MEASURE; NOVEL METHODS; PIXEL INTENSITIES; SHAPE FROM FOCUS; SURFACE APPROXIMATION;

PIXELS;

EID: 76149146959     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20765     Document Type: Article

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