Thickness-dependent nonlinear absorption behaviors in polycrystalline ZnSe thin films

Optics Communications

Volumn 285, Issue 6, 2012, Pages 1471-1475

  Karatay, Ahmet ^a   Yaglioglu, H Gul ^a   Elmali, Ayhan ^a   Parlak, Mehmet ^b   Karaagac, Hakan ^b  

^a ANKARA UNIVERSITY   (Turkey)

^b MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

Nonlinear absorption; Saturable absorption; Semiconductor; Two photon absorption; Z scan

Indexed keywords

NONLINEAR ABSORPTIONS; SATURABLE ABSORPTION; SEMICONDUCTOR; TWO PHOTON ABSORPTION; Z-SCAN;

DEFECTS; GRAIN BOUNDARIES; PROBES; ULTRASHORT PULSES;

THIN FILMS;

EID: 84855866276     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2011.11.088     Document Type: Article

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