Infrared attenuated total reflection spectroscopy of quartz and silica micro- and nanoparticulate films

Journal of Physical Chemistry C

Volumn 116, Issue 1, 2012, Pages 37-43

  Müller, Christian Menno ^a   Molinelli, Alexandra ^b   Karlowatz, Manfred ^b   Aleksandrov, Alexandr ^b   Orlando, Thomas ^b   Mizaikoff, Boris ^a  

^a UNIVERSITY OF ULM   (Germany)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION WAVELENGTHS; ANALYTICAL PROBLEMS; ATTENUATED TOTAL REFLECTION SPECTROSCOPY; ATTENUATED TOTAL REFLECTIONS; EVANESCENT FIELDS; MATRIX; MIDINFRARED; MONODISPERSE; MONODISPERSE PARTICLES; NANO PARTICULATES; PARTICLE LAYER; PARTICULATE FILMS; POLARIZED IR; SILICA FILM; SILICA MICROSPHERES; SODA LIME GLASS; SOIL MATRICES; SPECTRAL RANGE; SPECTRAL SHIFT; STRETCH VIBRATIONS; UNDISTURBED SOILS; VISIBLE AND NEAR INFRARED; WEATHERING CONDITIONS; WEATHERING PROCESS;

FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED DEVICES; PARTICLE SIZE; PARTICLE SIZE ANALYSIS; QUARTZ; WATER ABSORPTION; WEATHERING;

ELECTROMAGNETIC WAVE REFLECTION;

EID: 84855863612     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp205137b     Document Type: Article

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