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Volumn 4, Issue 2, 2012, Pages 380-385
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High-throughput ultrasensitive characterization of chemical, structural and plasmonic properties of EBL-fabricated single silver nanoparticles
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM;
AFM IMAGE;
AMBIENT CONDITIONS;
BLUESHIFTS;
CHEMICAL COMPOSITIONS;
DARK-FIELD;
EFFECTIVE TOOL;
HIGH-THROUGHPUT;
IN-SITU;
LOCALIZED SURFACE PLASMON RESONANCE;
NANOARRAYS;
NON-INVASIVE;
PHYSICO-CHEMICAL STABILITY;
PLASMONIC;
PLASMONIC PROPERTIES;
REAL TIME;
SEM/EDS;
SILVER NANOPARTICLES;
STRUCTURAL AND OPTICAL PROPERTIES;
STRUCTURAL MORPHOLOGY;
ULTRASENSITIVE;
ELECTRON BEAMS;
FABRICATION;
NANOPARTICLES;
NANOSENSORS;
OPTICAL MICROSCOPY;
OPTICAL PROPERTIES;
PLASMONS;
SURFACE PLASMON RESONANCE;
SILVER;
NANOMATERIAL;
SILVER;
ARTICLE;
CHEMISTRY;
CONFORMATION;
CRYSTALLIZATION;
ELECTRON;
MACROMOLECULE;
MATERIALS TESTING;
METHODOLOGY;
PARTICLE SIZE;
RADIATION DOSE;
RADIATION EXPOSURE;
SURFACE PLASMON RESONANCE;
SURFACE PROPERTY;
ULTRASTRUCTURE;
CRYSTALLIZATION;
ELECTRONS;
MACROMOLECULAR SUBSTANCES;
MATERIALS TESTING;
MOLECULAR CONFORMATION;
NANOSTRUCTURES;
PARTICLE SIZE;
RADIATION DOSAGE;
SILVER;
SURFACE PLASMON RESONANCE;
SURFACE PROPERTIES;
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EID: 84855601531
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c1nr11368b Document Type: Article |
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Times cited : (21)
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References (30)
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