The importance of the majority carrier polarity and p-n junction in titanium dioxide films to their photoactivity and photocatalytic properties

Surface Science

Volumn 606, Issue 3-4, 2012, Pages

  Kaariainen M L ^a   Cameron, D C ^a  

^a LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

Atomic layer deposition; P and n type titanium dioxide; Photoactivity; Photocatalytic activity

Indexed keywords

ANATASE FILMS; CARRIER SEPARATION; CRYSTALLINITIES; DEGRADATION TEST; DEPOSITION CONDITIONS; DEPOSITION TEMPERATURES; MAJORITY CARRIERS; METHYLENE BLUE; P-N JUNCTION; P-TYPE; PHOTOACTIVITY; PHOTOCATALYTIC ACTIVITIES; PHOTOCATALYTIC PROPERTY; POLYCRYSTALLINE TITANIUM; RUTILE FILMS; TITANIUM DIOXIDE FILMS; WATER CONTACT ANGLE;

ATOMIC LAYER DEPOSITION; CONTACT ANGLE; OXIDE MINERALS; PHOTOCATALYSIS; PHOTODEGRADATION; SEMICONDUCTOR JUNCTIONS; TITANIUM; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

TITANIUM DIOXIDE;

EID: 84855469101     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2011.11.009     Document Type: Article

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