Local vs. global models for effort estimation and defect prediction

2011 26th IEEE/ACM International Conference on Automated Software Engineering, ASE 2011, Proceedings

Volumn , Issue , 2011, Pages 343-351

  Menzies, Tim ^a   Butcher, Andrew ^a   Marcus, Andrian ^b   Zimmermann, Thomas ^c   Cok, David ^d  

^a WEST VIRGINIA UNIVERSITY   (United States)

^b Wayne State University   (United States)

^c MICROSOFT RESEARCH   (United States)

^d GRAMMATECH INC   (United States)

Author keywords

Data mining; defect effort estimation; empirical SE; validation

Indexed keywords

DATA MINERS; DEFECT PREDICTION; EFFORT ESTIMATION; GLOBAL MODELS; SOFTWARE MODULES; VALIDATION;

DATA MINING; DEFECTS; ESTIMATION;

SOFTWARE ENGINEERING;

EID: 84855468350     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASE.2011.6100072     Document Type: Conference Paper

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