The role of chiral local field enhancements below the resolution limit of Second Harmonic Generation microscopy

Optics Express

Volumn 20, Issue 1, 2012, Pages 256-264

  Valev, V K ^a   Clercq, B D ^b   Zheng, X ^a   Denkova, D ^a   Osley, E J ^c   Vandendriessche, S ^a   Silhanek, A V ^a   Volskiy, V ^a   Warburton, P A ^c   Vandenbosch, G A E ^a   Ameloot, M ^b   Moshchalkov, V V ^a   Verbiest, T ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b HASSELT UNIVERSITY   (Belgium)

^c UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DICHROISM; NANOSTRUCTURES; NONLINEAR OPTICS; OPTICAL VARIABLES MEASUREMENT;

CIRCULAR DICHROISM EFFECT; DOMINANT CONTRIBUTIONS; GOLD NANOSTRUCTURES; LOCAL FIELD ENHANCEMENT; NANOSTRUCTURED SYSTEMS; RESOLUTION LIMITS; SECOND HARMONIC GENERATION MICROSCOPY; SHG SIGNALS; STRUCTURAL DEFECT;

HARMONIC GENERATION;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 84855460322     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.000256     Document Type: Article

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