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Journal of Alloys and Compounds

Volumn 515, Issue , 2012, Pages 166-170

Structural and piezoelectric characteristics of BNT-BT 0.05 thin films processed by sol-gel technique

(5) Cernea, Marin a Trupina, Lucian a Dragoi, Cristina a Vasile, Bogdan S b Trusca, Roxana c

a NATIONAL INSTITUTE OF MATERIALS PHYSICS (Romania)

b UNIVERSITY POLITEHNICA OF BUCHAREST (Romania)

c Metav SA Bucuresti (Romania)

Author keywords

(Bi 0.5Na 0.5) 0.95Ba 0.05TiO 3 thin films; Piezoelectric properties; Sol gel processes

Indexed keywords

APPLIED VOLTAGES; AVERAGE SIZE; LEAD-FREE; LEAD-FREE FERROELECTRIC MATERIALS; MULTIPLE DOMAINS; NANO SCALE; PEROVSKITE PHASE; PIEZOELECTRIC CHARACTERISTICS; PIEZOELECTRIC PROPERTIES; PIEZOFORCE MICROSCOPY; POLYCRYSTALLINE FERROELECTRICS; PRIMARY PARTICLES; ROOT MEAN SQUARE ROUGHNESS; SMOOTH SURFACE; SOL-GEL TECHNIQUE; TIO; ZERO-BIAS VOLTAGE;

BARIUM; ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; FERROELECTRICITY; GELS; PEROVSKITE; PIEZOELECTRICITY; SILICON COMPOUNDS; SODIUM; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS;

FERROELECTRIC FILMS;

EID: 84855442477 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2011.11.129 Document Type: Article

Times cited : (71)

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