Understanding the failure mechanisms of protection diodes during system level ESD: Toward repetitive stresses robustness

IEEE Transactions on Electron Devices

Volumn 59, Issue 1, 2012, Pages 108-113

  Diatta, Marianne ^a,b   Trémouilles, David ^a   Bouyssou, Emilien ^b   Perdreau, Raphaël ^b   Anceau, Christine ^b   Bafleur, Marise ^a  

^a LAAS CNRS   (France)

^b STMICROELECTRONICS   (France)

Author keywords

Electrostatic discharge (ESD); failure mechanisms; protection diode; system level

Indexed keywords

ELECTRICAL BEHAVIORS; ELECTRONIC SYSTEMS; FAILURE MECHANISM; FAILURE MECHANISMS; METAL MODELS; PROTECTION DEVICE; PROTECTION DIODE; PROTECTION DIODES; SILICON-OXIDE INTERFACES; SYSTEM LEVEL; SYSTEM LEVELS; SYSTEM-LEVEL ESD;

DIODES; ELECTROSTATIC DISCHARGE; METALLIC COMPOUNDS; SILICON OXIDES;

ELECTROSTATIC DEVICES;

EID: 84855423871     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2011.2173576     Document Type: Article

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