Texture vs morphology in ZnO nano-rods: On the x-ray diffraction characterization of electrochemically grown samples

Journal of Applied Physics

Volumn 110, Issue 12, 2011, Pages

  Ariosa, D ^a,b   Elhordoy, F ^a   Dalchiele, E A ^a   Marotti, R E ^a   Stari, C ^a  

^a INSTITUTO DE FÍSICA   (Uruguay)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC MATERIAL; COATED GLASS SUBSTRATES; GEOMETRICAL CONSIDERATIONS; GOLD THIN FILMS; GRAZING INCIDENCE DIFFRACTION; INTENSITY RATIO; ISOTROPIC GRAINS; POWDER DIFFRACTION; POWDER DIFFRACTOMETERS; POWDER X RAY DIFFRACTION; QUANTITATIVE DETERMINATIONS; RELATIVE INTENSITY; SCANNING ELECTRON MICROSCOPES; TEXTURE CHARACTERIZATIONS; TEXTURE COEFFICIENT; TYPICAL SAMPLES; XRD; XRD TEXTURE; ZNO;

ASPECT RATIO; CHARACTERIZATION; DEPOSITION; DIFFRACTOMETERS; GOLD COATINGS; GOLD DEPOSITS; MORPHOLOGY; NANORODS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; STANDARDS; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; ZINC OXIDE;

TEXTURES;

EID: 84855323069     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3669026     Document Type: Article

References (15)

1. L. Vayssieres, Adv. Mater. 15, 464 (2003). 10.1002/adma.200390108
2. J. B. Baxter, A. M. Walker, K. van Ommering, and E. S. Aydil, Nanotechnology 17, S304 (2006). 10.1088/0957-4484/17/11/S13 (Pubitemid 43814946)
3. J. H. Yang, G. M. Liu, J. Lu, Y. F. Qiu, and S. H. Yang, Appl. Phys. Lett. 90, 103109 (2007). 10.1063/1.2711532 (Pubitemid 46398466)
4. H. H. Guo, J. Z. Zhou, and Z. H. Lin, Electrochem. Commun. 10, 146 (2008). 10.1016/j.elecom.2007.11.010 (Pubitemid 50009231)
5. Y. Hames, Z. Alpaslan, A. Ksemen, S. E. San, and Y. Yerli, Sol. Energy, 84, 426 (2010). 10.1016/j.solener.2009.12.013
6. H. D. Yu, Z. P. Zhang, M. Y. Han, X. T. Hao, and F. R. Zhu, J. Am. Chem. Soc. 127, 2378 (2005). 10.1021/ja043121y (Pubitemid 40327787)
7. J. H. Park, P. Muralidharan, and D. K. Kim, Mater. Lett. 63, 1019 (2009). 10.1016/j.matlet.2009.01.076
8. E. A. Dalchiele, R. E. Marotti, A. Cortés, G. Riveros, H. Gmez, L. Martnez, R. Romero, D. Leinen, F. Martin, and J. R. Ramos-Barrado, Physica E 37, 184 (2007). 10.1016/j.physe.2006.07.003 (Pubitemid 46420553)
9. G. Riveros, H. Gmez, A. Cortés, R. E. Marotti, and E. A. Dalchiele, Appl. Phys. A 81, 1724 (2005). 10.1007/s00339-004-3112-1 (Pubitemid 40609459)
10. C. Barret and T. B. Massalski, Structure of Metals (Pergamon, Oxford, 1980), p. 1923.
11. G. B. Harris, Philos. Mag. 43, 113 (1952).
12. M. D. Vaudin, M. W. Rupich, M. Jowett, G. N. Riley, Jr., and J. F. Bingert, J. Mater. Res. 13, 2910 (1998). 10.1557/JMR.1998.0398
13. Joint Committee on Powder Diffraction Standards, Powder diffraction files: PDF-01-075-0576 for ZnO and PDF-01-077-0488 for SnO2.
14. B. D. Cullity and S. Rstock, Elements of X-ray Diffraction (Prentice-Hall, New Jersey, 2001).
15. The apparent 4-fold symmetry in Figure is due to the rectangular shape of the sample surface under the elongated X-ray beam illumination.