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Volumn 2, Issue , 2003, Pages 1120-1123
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Mass-loaded cantilevers with suppressed higher-order modes for magnetic resonance force microscopy
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Author keywords
Electron microscopy; Fabrication; Force measurement; Frequency; Magnetic force microscopy; Magnetic noise; Magnetic resonance; Noise reduction; Silicon; Testing
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Indexed keywords
ACTUATORS;
ELECTRON MICROSCOPY;
ELECTROSPINNING;
FABRICATION;
FORCE MEASUREMENT;
MAGNETIC FORCE MICROSCOPY;
MAGNETIC MOMENTS;
MAGNETIC RESONANCE;
MAGNETISM;
MICROSYSTEMS;
NANOCANTILEVERS;
NOISE ABATEMENT;
RESONANCE;
SILICON;
SILICON WAFERS;
SINGLE CRYSTALS;
SOLID-STATE SENSORS;
SPIN DYNAMICS;
TESTING;
TRANSDUCERS;
FABRICATION PROCESS;
FREQUENCY;
HIGHER-ORDER MODES;
LOW TEMPERATURES;
MAGNETIC NOISE;
MAGNETIC RESONANCE FORCE MICROSCOPY;
SELECTIVE SILICON EPITAXY;
SINGLE CRYSTAL SILICON CANTILEVERS;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
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EID: 84855311197
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SENSOR.2003.1216966 Document Type: Conference Paper |
Times cited : (46)
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References (8)
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