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Volumn 2, Issue , 2003, Pages 1120-1123

Mass-loaded cantilevers with suppressed higher-order modes for magnetic resonance force microscopy

Author keywords

Electron microscopy; Fabrication; Force measurement; Frequency; Magnetic force microscopy; Magnetic noise; Magnetic resonance; Noise reduction; Silicon; Testing

Indexed keywords

ACTUATORS; ELECTRON MICROSCOPY; ELECTROSPINNING; FABRICATION; FORCE MEASUREMENT; MAGNETIC FORCE MICROSCOPY; MAGNETIC MOMENTS; MAGNETIC RESONANCE; MAGNETISM; MICROSYSTEMS; NANOCANTILEVERS; NOISE ABATEMENT; RESONANCE; SILICON; SILICON WAFERS; SINGLE CRYSTALS; SOLID-STATE SENSORS; SPIN DYNAMICS; TESTING; TRANSDUCERS;

EID: 84855311197     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2003.1216966     Document Type: Conference Paper
Times cited : (46)

References (8)
  • 3
    • 0035851551 scopus 로고    scopus 로고
    • Sub-attonewton force detection at milliKelvin temperatures
    • "Sub-attonewton force detection at milliKelvin temperatures," H.J. Mamin, D. Rugar, Appl. Phys. Lett., 79 (20), pp. 3358-60, 2001.
    • (2001) Appl. Phys. Lett. , vol.79 , Issue.20 , pp. 3358-3360
    • Mamin, H.J.1    Rugar, D.2
  • 4
    • 84944802024 scopus 로고    scopus 로고
    • personal communication
    • J.A. Sidles, personal communication.
    • Sidles, J.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.