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Volumn 2012, Issue , 2012, Pages

Instrument for label-free detection of noncoding RNAs

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84855261942     PISSN: 1687725X     EISSN: 16877268     Source Type: Journal    
DOI: 10.1155/2012/208079     Document Type: Article
Times cited : (6)

References (16)
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    • Analyzing gene expression using combined nanomechanical cantilever sensors
    • ARTICLE 090
    • Huber F., Backmann N., Grange W., Hegner M., Gerber C., Lang H. P., Analyzing gene expression using combined nanomechanical cantilever sensors Journal of Physics 2007 61 1, article 090 450 453
    • (2007) Journal of Physics , vol.61 , Issue.1 , pp. 450-453
    • Huber, F.1    Backmann, N.2    Grange, W.3    Hegner, M.4    Gerber, C.5    Lang, H.P.6
  • 3
    • 43449126805 scopus 로고    scopus 로고
    • Label-free detection of DNA hybridization based on hydration-induced tension in nucleic acid films
    • DOI 10.1038/nnano.2008.91, PII NNANO200891
    • Mertens J., Rogero C., Calleja M., Ramos D., Martn-Gago J. A., Briones C., Tamayo J., Label-free detection of DNA hybridization based on hydration-induced tension in nucleic acid films Nature Nanotechnology 2008 3 5 301 307 (Pubitemid 351668057)
    • (2008) Nature Nanotechnology , vol.3 , Issue.5 , pp. 301-307
    • Mertens, J.1    Rogero, C.2    Calleja, M.3    Ramos, D.4    Martin-Gago, J.A.5    Briones, C.6    Tamayo, J.7
  • 8
    • 60149088848 scopus 로고    scopus 로고
    • Origins and Mechanisms of miRNAs and siRNAs
    • Carthew R. W., Sontheimer E. J., Origins and Mechanisms of miRNAs and siRNAs Cell 2009 136 4 642 655
    • (2009) Cell , vol.136 , Issue.4 , pp. 642-655
    • Carthew, R.W.1    Sontheimer, E.J.2
  • 12
    • 21544451468 scopus 로고
    • Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
    • Meyer G., Amer N. M., Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope Applied Physics Letters 1990 57 20 2089 2091
    • (1990) Applied Physics Letters , vol.57 , Issue.20 , pp. 2089-2091
    • Meyer, G.1    Amer, N.M.2
  • 14
    • 0036801166 scopus 로고    scopus 로고
    • Nanomechanics from atomic resolution to molecular recognition based on atomic force microscopy technology
    • Lang H. P., Hegner M., Meyer E., Gerber C., Nanomechanics from atomic resolution to molecular recognition based on atomic force microscopy technology Nanotechnology 2002 13 5 R29 R36
    • (2002) Nanotechnology , vol.13 , Issue.5
    • Lang, H.P.1    Hegner, M.2    Meyer, E.3    Gerber, C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.