Highly selective solid-phase extraction of trace Pd(II) by murexide functionalized halloysite nanotubes

Analytica Chimica Acta

Volumn 713, Issue , 2012, Pages 136-144

  Li, Ruijun ^a,b   He, Qun ^a,b   Hu, Zheng ^a,b   Zhang, Shengrui ^a,b   Zhang, Lijun ^c   Chang, Xijun ^a,b  

^a LANZHOU UNIVERSITY   (China)

^b Key Laboratory of Nonferrous Metal Chemistry and Resources Utilization of Gansu Province   (China)

^c CURTIN UNIVERSITY   (Australia)

Author keywords

Halloysite nanotube; Inductively coupled plasma optical emission spectrometry; Palladium(II); Solid phase extraction

Indexed keywords

ADSORPTION CAPACITIES; ADSORPTION DESORPTION ISOTHERMS; ANALYSIS TIME; ANALYTES; CERTIFIED REFERENCE MATERIALS; DETECTION LIMITS; ELUTION CONDITIONS; ENRICHMENT FACTORS; FOURIER; FUNCTIONALIZED; HALLOYSITE NANOTUBES; INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROMETRY; INFRARED SPECTRUM; INTERFERING IONS; MUREXIDE; OPTIMIZED CONDITIONS; OPTIMUM CONDITIONS; PRE-CONCENTRATION; RELATIVE STANDARD DEVIATIONS; SCANNING ELECTRON MICROSCOPE; SELECTIVE SOLID-PHASE EXTRACTION; SOLID-PHASE EXTRACTION; SOLUTION SAMPLES; TRANSMISSION ELECTRON MICROSCOPE;

ADSORPTION; DESORPTION; DYES; FLOW RATE; HYDROCHLORIC ACID; INDUCTIVELY COUPLED PLASMA; KAOLINITE; LIGHT EMISSION; NANOTUBES; OPTICAL EMISSION SPECTROSCOPY; OPTIMIZATION; PALLADIUM COMPOUNDS; PH EFFECTS; PHASE SEPARATION; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; SPECTROSCOPY; THIOUREAS; TRACE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EXTRACTION;

ADSORBENT; MUREXIDE; NANOTUBE; PALLADIUM; THIOUREA; TRACE METAL;

ADSORPTION KINETICS; ARTICLE; ATOMIC EMISSION SPECTROMETRY; CHEMICAL ANALYSIS; CONCENTRATION (PARAMETERS); CONTROLLED STUDY; DESORPTION; ELUTION; FLOW RATE; INFRARED SPECTROSCOPY; ISOTHERM; LIMIT OF DETECTION; METAL RECOVERY; PH; PRIORITY JOURNAL; PROCESS OPTIMIZATION; QUANTITATIVE STUDY; SCANNING ELECTRON MICROSCOPY; SEPARATION TECHNIQUE; SOLID PHASE EXTRACTION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 84855201733     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2011.11.047     Document Type: Article

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