On the enduring appeal of least-squares fitting in computational coordinate metrology

Journal of Computing and Information Science in Engineering

Volumn 12, Issue 1, 2012, Pages

  Srinivasan, Vijay ^a   Shakarji, Craig M ^a   Morse, Edward P ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of North Carolina at Charlotte   (United States)

Author keywords

coordinate metrology; least squares fitting; manufacturing; optimization; sampling; standardization

Indexed keywords

COORDINATE METROLOGY; GEOMETRIC FEATURE; INTERNATIONAL STANDARDIZATION; LEAST SQUARE; LEAST-SQUARES FITTING; MANUFACTURING APPLICATIONS;

GEOMETRY; MANUFACTURE; OPTIMIZATION; SAMPLING; SPECIFICATIONS; STANDARDIZATION; SURVEYS;

UNITS OF MEASUREMENT;

EID: 84855170473     PISSN: 15309827     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.3647877     Document Type: Article

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