Enhanced sensitivity to oxide surface defects using Augerphotoelectron coincidence spectroscopy

Surface Science

Volumn 383, Issue 2-3, 1997, Pages

  See, A K ^a,d   Siu, W K ^a   Bartynski, R A ^a   Nangia, A ^b   Weiss, A H ^b   Hulbert, S L ^c   Wu, X ^c   Kao, C C ^c  

^a RUTGERS UNIVERSITY   (United States)

^b UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d CHARTERED SEMICONDUCTOR MANUFACTURING LTD   (Singapore)

Author keywords

Auger ejection; Auger electron spectroscopy; Photoelectron emission; Surface defects; Titanium oxide

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; DEFECTS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; PHOTOELECTRON SPECTROSCOPY; REDOX REACTIONS; STOICHIOMETRY;

AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY (APECS);

TITANIUM DIOXIDE;

EID: 0031191906     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00165-9     Document Type: Article

References (32)

1. Y.W. Chung, W.J. Lo, G.A. Somorjai, Surf. Sci. 64 (1977) 588.
2. W. Göpel, G. Rocker, R. Feierabend, Phys. Rev. B 28 (1983) 3427.
3. W. Göpel, J.A. Anderson, D. Frankel, M. Jaehnig, K. Phillips, J.A. Schäfer, G. Rocker, Surf. Sci. 139 (1984) 333.
4. V.E. Henrich, G. Dresselhaus, H.J. Zeiger, Phys. Rev. Lett. 36 (1976) 1335.
5. V.E. Henrich, G. Dresselhaus, H.J. Zeiger, Solid State Commun. 24 (1977) 623.
6. V.E. Henrich, G. Dresselhaus, H.J. Zeiger, J. Vac. Sci. Technol. 15 (1978) 534.
7. K.E. Smith, J.L. Mackay, V.E. Henrich, Phys. Rev. B 35 (1987) 5822.
8. J.-M. Pan, B.L. Maschhoff, U. Diebold, T.E. Madey, J. Vac. Sci. Technol. A 10 (1992) 2471.
9. H.R. Sadeghi, V.E. Henrich, J. Catal. 109 (1988) 1.
10. U. Diebold, J.-M. Pan, T.E. Madey, Phys. Rev. B 47 (1993) 3868.
11. M.C. Wu, P.J. Møller, Surf. Sci. 224 (1989) 250.
12. Z. Zhang, V.E. Henrich, Surf. Sci. 277 (1992) 263.
13. C.C. Kao, S.C. Tsai, M.K. Bahl, Y.W. Chung, W.J. Lo, Surf. Sci. 95 (1980) 1.
14. A. Fujishima, K. Honda, Nature 238 (1972) 37.
15. A. Linsebigler, G. Lu, J.T. Yates, Jr., Chem. Rev. 95 (1995) 735.
16. G. Lu, A. Linsebigler, J.T. Yates, Jr., J. Phys. Chem. 98 (1994) 11733.
17. G. Lu, A. Linsebigler, J.T. Yates, Jr., J. Chem. Phys. 102 (1995) 4657.
18. Y. Gao, S.A. Joyce, Y. Liang, S.A. Chambers, Surf. Sci. 365 (1996) 638.
19. R.L. Kurtz, R. Stockbauer, T.E. Madey, E. Román, J.L. deSegovia, Surf. Sci. 218 (1989) 178.
20. W.K. Siu, A.K. See, R.A. Bartynski, A. Nangia, A. Weiss, X. Wu, S.L. Hulbert, J. Chem. Phys. 00 (1997) 000 (to be published).
21. E. Jensen, R.A. Bartynski, S.L. Hulbert, E.D. Johnson, Review in Scientific Instruments 63 (1992) 3013.
22. R.A. Bartynski, E. Jensen, S.L. Hulbert, Physica Scripta T41 (1992) 168.
23. V.E. Henrich, P.A. Cox, The Surface Science of Metal Oxides. Cambridge University Press, Cambridge, 1994.
24. A.K. See, R.A. Bartynski, Phys. Rev. B, forthcoming.
25. U. Diebold, J.F. Anderson, K.-O. Ng, D. Vanderbilt, Phys. Rev. Lett. 77 (1996) 1322.
26. J. Mckay, V.E. Henrich, Surf. Sci. 137 (1984) 463.
27. G.A. Sawatzky, in: C.L. Bryant, R.P. Messmer (Eds.) Auger Electron Spectroscopy, p. 167. Academic Press, Boston, 1988.
28. E. Jensen, R.A. Bartynski, M. Weinert, S.L. Hulbert, E.D. Johnson, R.F. Garrett, Phys. Rev. B 41 (1990) 12468.
29. W.-X. Xu, D.D. Schierbaum, W. Göpel, J. Solid State Chem. 119 (1994) 237.
30. U.K. Kirner, Tübingen University, 1991 (unpublished data).
31. D.W. Fischer, Phys. Rev. B 5 (1972) 4219.
32. K. Tsutsumi, O. Aita, K. Ichikawa, Phys. Rev. B 15 (1977) 4638.